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Accessory for Step Platforms: Atomic Force Microscope (AFM)
4.2 (123 items)
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$54.00 cheaper than the new price!!
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Product details
| Management number | 211306260 | Release Date | 2026/04/04 | List Price | $36.00 | Model Number | 211306260 | ||
|---|---|---|---|---|---|---|---|---|---|
| Category | |||||||||
The morphology of high-tech surfaces, with features down to a few nanometers, is crucial. Our Atomic Force Microscope (AFM) can be integrated with scratch and indentation testers on a flexible Step platform, enabling straightforward examination of these minute features under ambient conditions. It provides nanoscale resolution, accurate mapping, and diverse quantitative measurements for material assessment.
- Multipurpose AFM for diverse scientific and industrial uses
- High-resolution imaging and analysis for nanoscale surface details
- Gentle, non-damaging sample interaction
| Brand | Anton Paar |
|---|---|
| Color | black |
| Manufacturer | Anton Paar |
| Compatible Devices | Personal Computer, Laptop |
| Enclosure Material | Metal and Glass |
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